Browse Standards
3488+ standards in database
3488 result(s) found
化妆品中荧光增白剂367和荧光增白剂393的测定 液相色谱-串联质谱法
Determination of fluorescent brightener 367 and fluorescent brightener 393 in cosmetics—Liquid chromatography-tandem mass spectrometry
化学品管理信息化 第3部分：电子标签应用
Informationalized management of chemicals—Part 3: Electronic label application
微束分析 用于波谱和能谱分析的粉末试样制备方法
Microbeam analysis—Method of specimen preparation for analysis of general powders using WDS and EDS
搪玻璃层试验方法 第1部分：耐碱性溶液腐蚀性能的测定
Test method of viterous and porcelain enamels—Part 1：Determination of resistance to alkaline liquids
表面化学分析 电子能谱 X射线光电子能谱峰拟合报告的基本要求
Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
表面化学分析 电子能谱 紫外光电子能谱分析指南
Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis
气流床水煤浆气化能效计算方法
Energy consumption efficiency evaluation method for entrained-flow coal-water slurry gasification
染料中间体 熔点范围测定通用方法
Dyes intermediates—General method for the determination of melting range
工业硫磺 第1部分：固体产品
Sulphur for industrial use—Part 1: Solid product
染料产品中多环芳烃的测定
Determination of polycyclic aromatic hydrocarbons in dye products
染料产品中含氯苯酚的测定
Determination of the content of chlorinated phenols in dye products
液体二氧化硫
Liquid sulphur dioxide
搪玻璃层试验方法 第3部分：耐温差急变性能的测定
Test method of viterous and porcelain enamels—Part 3：Determination of resistance to thermal shock
微束分析 薄晶体厚度的会聚束电子衍射测定方法
Microbeam analysis—Method of thickness measurement for thin crystals by convergent beam electron diffraction
微束分析 电子背散射衍射 钢中奥氏体的定量分析
Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
表面化学分析 中等分辨俄歇电子能谱仪 元素分析用能量标校准
Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
荧光增白剂 迁移性的测定
Fluorescent whitening agent—Determination of migration properties
硫化黑2BR、3B 200%
Sulphur black 2BR、3B 200%
C.I.分散紫26（分散紫HFRL）
C.I. Disperse violet 26（Disperse violet HFRL）
表面化学分析 深度剖析 用单层和多层薄膜测定X射线光电子能谱、俄歇电子能谱和二次离子质谱中深度剖析溅射速率的方法
Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films