Browse Standards

1450+ standards in database

1450 result(s) found

GB/T 44937.2-2025 即将实施

集成电路 电磁发射测量 第2部分:辐射发射测量 TEM小室和宽带TEM小室法

Integrated circuits—Measurement of electromagnetic emissions—Part 2: Measurement of radiated emissions—TEM cell and wideband TEM cell method

ICS: 31.200
2026-07-01
GB/T 44937.1-2025 即将实施

集成电路 电磁发射测量 第1部分: 通用条件和定义

Integrated circuits—Measurement of electromagnetic emissions—Part 1: General conditions and definitions

ICS: 31.200
2026-07-01
GB/T 4937.8-2025 即将实施

半导体器件 机械和气候试验方法 第8部分:密封

Semiconductor devices—Mechanical and climatic test methods—Part 8:Sealing

ICS: 31.080.01
2026-07-01
GB/T 6346.23-2025 即将实施

电子设备用固定电容器 第23部分:分规范 表面安装金属化聚萘二甲酸乙二醇酯膜介质直流固定电容器

Fixed capacitors for use in electronic equipment—Part 23:Sectional specification—Fixed metallized polyethylene naphthalate film dielectric surface mount DC capacitors

ICS: 31.060.30
2026-07-01
GB/T 15879.612-2025 即将实施

半导体器件的机械标准化 第6-12部分:表面安装半导体器件封装外形图绘制的一般规则 密节距焊盘阵列封装(FLGA)的设计指南

Mechanical standardization of semiconductor devices—Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages—Design guidelines for fine-pitch land grid array (FLGA)

ICS: 31.080.01
2026-07-01
GB/T 4937.39-2025 即将实施

半导体器件 机械和气候试验方法 第39部分:半导体器件用有机材料的潮气扩散率和水溶解度测量

Semiconductor devices—Mechanical and climatic test methods—Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components

ICS: 31.080.01
2026-07-01
GB/T 3352-2025 即将实施

人造石英晶体 规范与使用指南

Synthetic quartz crystal—Specifications and guidelines for use

ICS: 31.140
2026-07-01
GB/T 27700.2-2025 即将实施

有质量评定的声表面波滤波器 第2部分:使用指南

Surface acoustic wave (SAW) filters of assessed quality—Part 2: Guidelines for the use

ICS: 31.140
2026-07-01
GB/T 44807.2-2025 Active

集成电路电磁兼容建模 第2部分:集成电路电磁干扰特性仿真模型 传导发射建模(ICEM-CE)

EMC IC modelling—Part 2: Models of integrated circuits for EMI behavioural simulation—Conducted emissions modelling (ICEM-CE)

ICS: 31.200
2026-04-01
GB/T 22319.8-2025 即将实施

石英晶体元件参数的测量 第8部分:表面贴装石英晶体元件用测量夹具

Measurement of quartz crystal unit parameters—Part 8: Test fixture for surface mounted quartz crystal units

ICS: 31.140
2026-07-01
GB/T 19405.4-2025 即将实施

表面安装技术 第4部分:湿敏器件的处理、标记、包装和分类

Surface mounting technology—Part 4: Classification, packaging, labelling and handling of moisture sensitive devices

ICS: 31.180
2026-07-01
GB/T 46821-2025 Active

嵌入式基板测试方法

Test methods for device embedded substrate

ICS: 31.180
2026-04-01
GB/T 46892-2025 即将实施

高亮度LED用印制板热导率测试方法

Test method for thermal conductivity of electronic circuit boards for high-brightness LEDs

ICS: 31.180
2026-07-01
GB/T 33772.3-2025 即将实施

质量评定体系 第3部分:印制板及层压板最终产品检验及过程监督用抽样方案的选择和使用

Quality assessment systems—Part 3: Selection and use of sampling plans for printed board and laminate end-product and in-process auditing

ICS: 31.180
2026-07-01
GB/T 44807.3-2025 即将实施

集成电路电磁兼容建模 第3部分:集成电路电磁干扰特性仿真模型 辐射发射建模(ICEM-RE)

EMC IC modelling—Part 3: Models of integrated circuits for EMI behavioural simulation—Radiated emissions modelling (ICEM-RE)

ICS: 31.200
2026-07-01
GB/T 4937.40-2025 即将实施

半导体器件 机械和气候试验方法 第40部分:采用应变仪的板级跌落试验方法

Semiconductor devices—Mechanical and climatic test methods—Part 40: Board level drop test method using a strain gauge

ICS: 31.080.01
2026-07-01
GB/T 6346.1401-2025 即将实施

电子设备用固定电容器 第14-1部分:空白详细规范 抑制电源电磁干扰用固定电容器 评定水平DZ

Fixed capacitors for use in electronic equipment—Part 14-1: Blank detail specification—Fixed capacitors for electromagnetic interference suppression and connection to the supply mains—Assessment level DZ

ICS: 31.060.10
2026-07-01
GB/T 7247.12-2026 即将实施

激光产品的安全 第12部分:用于信息传输的自由空间光通信系统的安全

Safety of laser products—Part 12: Safety of free space optical communication systems used for transmission of information

ICS: 31.260
2026-08-01
GB/T 6115.3-2026 即将实施

电力系统用串联电容器 第3部分:内部熔丝

Series capacitors for power systems—Part 3:Internal fuses

ICS: 31.060.70
2026-08-01
GB/T 6115.1-2026 即将实施

电力系统用串联电容器 第1部分:总则

Series capacitors for power systems—Part 1:General

ICS: 31.060.70
2026-08-01
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