Browse Standards
1450+ standards in database
1450 result(s) found
人造石英光学低通滤波器晶片
Synthetic quartz crystal wafer for optical low pass filter (OLPF)
等离子体显示器件 第2-4部分：数字电视机用器件特性测量方法
Plasma display panels—Part 2-4: Methods for measuring the characteristics of devices for digital television sets
多层印制板用粘结片试验方法
Test methods for bongding sheet for multilayer printed boards
多层印制板用粘结片通用规则
General rules for bonding sheet for multilayer printed boards
电子电气产品中的限用物质三丁基锡和三苯基锡的测定 气相色谱-质谱法
Determination of restricted substances including tributyltin and triphenyltin in electrical and electronic products—Gas chronatography-mass spectrometry
电子电气产品中限用物质筛选应用通则 X射线荧光光谱法
General rules of screening application of restricted substances in electrical and electronic products—X-Ray fluorescence spectrometry
电子电气产品中砷、铍、锑的测定 第1部分：电感耦合等离子体质谱法
Determination of arsenic,beryllium,antimony in electrical and electronic products—Part 1:Inductively coupled plasma mass spectrometry spectrometry
电子电气产品中短链氯化石蜡的测定 气相色谱-质谱法
Determination of short chain chlorinated paraffins in electrical and electronic products—Gas chromatography-mass spectrometry
电子电气产品中2,4-二硝基甲苯的测定 气相色谱-质谱法
Determination of 2,4-dinitro-toluene in electrical and electronic products—Gas chromatography-mass spectrometry
纳米技术 晶圆级纳米尺度相变存储单元电学操作参数测试规范
Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells
半导体分立器件型号命名方法
The rule of type designation for discrete semiconductor devices
印制电路用刚性覆铜箔层压板试验方法
Test methods for rigid copper clad laminates for printed circuits board
质量评定体系 第1部分：印制板组件上缺陷的统计和分析
Quality assessment systems—Part 1: Registration and analysis of defects on printed board assemblies
印制板总规范
General specification for printed circuit boards
半导体器件 分立器件 第5-4部分:光电子器件 半导体激光器
Semiconductor devices—Discrete devices—Part 5-4:Optoelectronic devices—Semiconductor lasers
掺钕钇铝石榴石激光棒
Neodymium-doped Yttrium Aluminum Garnet laser rods
印制板导线电阻测试方法
Test method for resistance of conductors of printed boards
有质量评定的石英晶体元件 第1部分:总规范
Quartz crystal units of assessed quality—Part 1:Generic specification
激光棒波前畸变的测量方法
Test method for wavefront distortion of laser rods
MEMS高g值加速度传感器性能试验方法
Test methods of the performance for MEMS high g accelerometer