Browse Standards
1450+ standards in database
1450 result(s) found
激光加工机械 金属切割的性能规范与标准检查程序
Laser processing machines--Performance specifications and benchmarks for cutting of metals
集成电路TSV三维封装可靠性试验方法指南
Integrated circuit TSV 3D package reliability test methods guideline
半导体器件 基于扫描的半导体器件退化水平评估
Semiconductor devices—Scan based ageing level estimation for semiconductor devices
半导体器件 分立器件 第17部分：基本绝缘和加强绝缘的磁耦合器和电容耦合器
Semiconductor devices—Discrete devices—Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
电子管管基尺寸
Dimensions of electronic tube bases
压电陶瓷材料体积密度测量方法
Piezoelectric ceramic materials--Measuring methods for determination of volume density
寿命试验和加速寿命试验的最好线性无偏估计法(用于威布尔分布)
Life test and acceleration life test--Optimal linear deflection-free--Evaluation of Weibull distributions
寿命试验和加速寿命试验的简单线性无偏估计法(用于威布尔分布)
Life test and acceleration life test--Simple linear deflection-free--Evaluation ofWeibull distributions
寿命试验和加速寿命试验的图估计法 (用于威布尔分布)
Life test and acceleration life test charts--Evaluation of their Weibull distributions
恒定应力寿命试验和加速寿命试验方法 总则
Constant stress life tests and acceleration life tests--General rules
电子管外形尺寸
Outline dimensions of electrnic tubes
电子管引出帽连接尺寸
Connecting dimensions for caps of electronic tubes
小功率电子管灯丝断续试验方法
Method of heater intermittent test of low-power electronic tubes
人造石英晶体的型号命名
Designations for synthetic quartz crystals
液晶显示器件型号命名方法
The rule of type designation of liquid crystal display devices
阴极射线致荧光粉测试方法
Measuring method of the phosphor excited by cathod rays
光致荧光粉测试方法
Measuring method for the phosphor excited by light
电子设备用可变电容器的试验方法
Methods of test of variable capacitors in electronic equipment
半导体集成电路线性放大器系列和品种
Families and products of linear amplifier for semiconductor integrated circuits
直流固定金属化纸介电容器总规范
Generic specification for fixed metallized paper dielectric capacitors for direct current