Browse Standards

铀矿石浓缩物中磷的测定 分光光度法

Determination of phosphorus in uranium ore concentrate by spectrophotometry

铀矿石浓缩物中铁、钙、镁、钼、钛、钒的测定 原子吸收光谱法

Determination of iron，calcium，magnesium，molybdenum，titanium and vanadium in uranium oreconcentrate by atomic absorption spectrometry

铀矿石浓缩物中钾、钠的测定 原子吸收光谱法

Determination of potassium and sodium in uranium ore concentrate by atomic absorption spectrometry

铀矿石浓缩物中锆的测定 二甲酚橙分光光度法

Determination of zirconium in uranium ore concentrate by xylenol orange spectrophotometric method

小功率发射管的使用和维护

Application and care for small power transmitting tubes

脉冲调制管空白详细规范 (可供认证用)

Blank detail specification for pulse modulator tubes

氢闸流管空白详细规范 (可供认证用)

Blank detail specification for hydrogen thyratrons

实验室玻璃仪器 分度吸量管

Laboratory glassware--Graduated pipettes

脉冲闸流管总规范 (可供认证用)

General specification for pulse thyratrons

电视广播接收机在非标准广播信号条件下的测量方法

Methods of measurement under conditions different from broadcast signal standards on receivers for television broadcast transmissions

硬质泡沫塑料平均泡孔尺寸试验方法

Test method for average cell size of rigid cellular plastics

实验室玻璃仪器 玻璃量器的容量校准和使用方法

Laboratory glassware--Volumetric glassware--Methods for use and testing of capacity

地面无线电导航设备环境要求和试验方法

Environment requirements and testmethods for ground radio-navigation equipments

程序设计语言 BASIC 子集

Programming languages BASIC subset

半导体集成电路非线性电路系列和品种 电压/ 频率和频率/ 电压转换器的品种

Series and products of nonlinear circuits for semiconductor integrated circuits--Products of voltage/frequency and frequency/voltage converters

半导体集成电路非线性电路系列和品种 采样/ 保持放大器的品种

Series and products of nonlinear circuits for semi-conductor integrated circuits--Products of sample/hold amplifiers

膜集成电路和混合膜集成电路术语

Terminology for film integrated circuits and hybrid film integrated circuits

滑动轴承薄壁轴瓦尺寸、结构要素与公差

Plain bearings--Thin-walled bearing shells--Dimensions，structure elements and tolerances

摄影密度测量的术语、符号、坐标系和函数表示法

Terms，symbols，coordinate system and functional notations for photographic density measurements

摄影反射密度测量的几何条件

Geometric conditions for photographic reflection density measurement