GB/T 4937.44-2025

Active

Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

半导体器件机械和气候试验方法第44部分：半导体器件的中子辐照单粒子效应（SEE）试验方法

Standard Type

GBT

ICS

31.080.01

CCS

L40

Status

现行

Issue Date

2025-12-02

Implementation

2026-07-01

Responsible Dept

工业和信息化部（电子）

Drafting Unit

N/A

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