GB/T 4937.31-2023

Active

Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devices（internally induced）

半导体器件机械和气候试验方法第31部分：塑封器件的易燃性（内部引起的）

Standard Type

GBT

ICS

31.080.01

CCS

L40

Status

现行

Issue Date

2023-05-23

Implementation

2023-12-01

Responsible Dept

工业和信息化部（电子）

Drafting Unit

N/A

🔗 Related Standards / 同类标准

GB/Z 107-2025 Semiconductor devices—Scan based ageing level estimation for semiconductor devices GB/Z 102.17-2026 Semiconductor devices—Discrete devices—Part 17: Magnetic and capacitive coupler for basic and reinforced insulation GB/T 6256-1986 Blank detail specification forindustrial heating triodes GB/T 7581-1987 Dimensions of outlines for semiconductor discrete devices GB/T 9432-1988 Blank detail specification for industrial heating tetrode GB/T 249-1989 The rule of type designation for discrete semiconductor devices GB/T 12300-1990 Test methods of safe operating area for power transistors GB/T 12847-1991 Blank detail specification for hydrogen thyratrons