GB/T 32999-2016
ActiveSurface chemical analysis—Depth profiling—Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
表面化学分析 深度剖析 用机械轮廓仪栅网复型法测量溅射速率
🔗 Related Standards / 同类标准
GB/Z 32490-2016
Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds
GB/Z 32494-2016
Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information
GB/Z 35959-2018
General rule for liquid chromatography-mass spectrometry
GB/Z 38062-2019
Nanotechnologies—Determination of specific surface area of graphene materials—Methylene blue adsorption method
GB/Z 41259-2022
Method for determination of quaternary ammonium compounds in preservative-treated wood and wood preservatives by potentiometric titrator
GB/Z 44564-2024
Safety instrumented systems—Process analysis technology systems
GB/Z 44604-2024
Analyser systems maintenance management
GB/Z 37664.2-2025
Nanomanufacturing—Key control characteristics—Luminescent nanoparticles—Part 2:Determination of mass of quantum dot in dispersion