GB/T 26068-2018

Active

Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method

硅片和硅锭载流子复合寿命的测试非接触微波反射光电导衰减法

Standard Type

GBT

ICS

77.040

CCS

H21

Status

现行

Issue Date

2018-12-28

Implementation

2019-11-01

Responsible Dept

国家标准委

Drafting Unit

N/A

🔗 Related Standards / 同类标准

GB/Z 38434-2019 Metallic materials—Guide to test pieces preparation for mechanical testing GB/Z 40387-2021 Metallic materials—Principles and designs for multiaxial fatigue testing GB/T 1814-1979 Inspection method for steel work fractures GB/T 3771-1983 Conversion of hardness and strength for copper alloys GB/T 4197-1984 Method for measuring the average grain size of sintered bar and rod of tungsten molybdenum and alloys GB/T 4196-1984 Method for testing the density of tungsten and molybdenum bars GB/T 4195-1984 Method for measuring the distribution of the powder size of tungsten and molybdenum method by the balance for the fall of the particles GB/T 4194-1984 Creep testing，high temperature treatment and metallographic examination of the tungsten wires