GB/T 26068-2010

Abolished

Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance

硅片载流子复合寿命的无接触微波反射光电导衰减测试方法

Standard Type

GBT

ICS

29.045

CCS

H80

Status

废止

Issue Date

2011-01-10

Implementation

2011-10-01

Responsible Dept

国家标准委

Drafting Unit

国家标准委

🔗 Related Standards / 同类标准

GB/T 16596-1996 Specification for establishing a wafer coordinatesystem GB/T 16595-1996 Specification for a universal wafer grid GB/T 12964-2003 Monocrystalline silicon polished wafers GB/T 20230-2006 Indium phosphide single crystal GB/T 20229-2006 Gallium phosphide single crystal GB/T 20228-2006 Gallium arsenide single crystal GB/T 11069-2006 High purity germanium　dioxide GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single　crystal and cutting wafer