GB/T 22572-2008

Active

Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials

表面化学分析二次离子质谱用多δ层参考物质评估深度分辨参数的方法

Standard Type

GBT

ICS

71.040.40

CCS

G04

Status

现行

Issue Date

2008-12-11

Implementation

2009-10-01

Responsible Dept

中国科学院

Drafting Unit

N/A

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