GB/T 16594-2008

Active

General rules for measurement of length in micron scale by SEM

微米级长度的扫描电镜测量方法通则

Standard Type

GBT

ICS

71.040.99

CCS

N53

Status

现行

Issue Date

2008-09-18

Implementation

2009-05-01

Responsible Dept

国家标准委

Drafting Unit

N/A

🔗 Related Standards / 同类标准

GB/Z 32490-2016 Surface chemical analysis—X-ray photoelectron spectroscopy—Procedures for determining backgrounds GB/Z 32494-2016 Surface chemical analysis—Auger electron spectroscopy—Derivation of chemical information GB/Z 35959-2018 General rule for liquid chromatography-mass spectrometry GB/Z 38062-2019 Nanotechnologies—Determination of specific surface area of graphene materials—Methylene blue adsorption method GB/Z 41259-2022 Method for determination of quaternary ammonium compounds in preservative-treated wood and wood preservatives by potentiometric titrator GB/Z 44564-2024 Safety instrumented systems—Process analysis technology systems GB/Z 44604-2024 Analyser systems maintenance management GB/Z 37664.2-2025 Nanomanufacturing—Key control characteristics—Luminescent nanoparticles—Part 2:Determination of mass of quantum dot in dispersion