GB/T 15651.3-2003

Active

Discrete semiconductor devices and integrated circuits--Part 5-3:Optoelectronic devices--Measuring methods

半导体分立器件和集成电路第5-3部分:光电子器件测试方法

Standard Type

GBT

ICS

31.260

CCS

L50

Status

现行

Issue Date

2003-11-24

Implementation

2004-08-01

Responsible Dept

工业和信息化部（电子）

Drafting Unit

工业和信息化部（电子）

🔗 Related Standards / 同类标准

GB/Z 18462-2001 Laser processing machines--Performance specifications and benchmarks for cutting of metals GB/T 5295-1985 The spectral response characteristic series of photocathodes GB/T 11297.2-1989 Test method for side direction scatteringcoefficient of laser rods GB/T 11295-1989 Designation for laser crystal rods GB/T 11293-1989 Terms and definitions of solid-state laser materials GB/T 12083-1989 Power supply series for gas lasers GB/T 12082-1989 Letter symbols for gas lasers GB/T 12565-1990 Semiconductor devices--Sectional specification for optoelectronic devices