GB/Z 107-2025

Active

Semiconductor devices—Scan based ageing level estimation for semiconductor devices

半导体器件 基于扫描的半导体器件退化水平评估

Standard Type
GBZ
ICS
31.080.01
CCS
L40
Status
现行
Issue Date
2025-12-03
Implementation
N/A
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A