Home / Standards / GB/T 6619-2009 GB/T 6619-2009 Active Test methods for bow of silicon wafers 硅片弯曲度测试方法 Standard Type GBT ICS 29.045 CCS H80 Status 现行 Issue Date 2009-10-30 Implementation 2010-06-01 Responsible Dept 国家标准委 Drafting Unit N/A