GB/T 5594.8-2015

Active

Test methods for properties of structure ceramic used in electronic components and device—Part 8: Test method for microstructure

电子元器件结构陶瓷材料性能测试方法第8部分：显微结构的测定方法

Standard Type

GBT

ICS

31-030

CCS

L90

Status

现行

Issue Date

2015-05-15

Implementation

2016-01-01

Responsible Dept

工业和信息化部（电子）

Drafting Unit

N/A