GB/T 4937.28-2026

Upcoming

Semiconductor devices—Mechanical and climate test methods—Part 28: Electrostatic discharge (ESD) sensitivity testing—Charged device model (CDM)—device level

半导体器件机械和气候试验方法第28部分：静电放电（ESD）敏感度测试带电器件模型（CDM）器件级

Standard Type

GBT

ICS

31.080.01

CCS

L40

Status

即将实施

Issue Date

2026-02-27

Implementation

2026-09-01

Responsible Dept

工业和信息化部（电子）

Drafting Unit

N/A