GB/T 47239.9-2026

Upcoming

Semiconductor devices—Flexible and stretchable semiconductor devices—Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

半导体器件 柔性可拉伸半导体器件 第9部分：一晶体管一电阻式（1T1R）电阻存储单元性能测试方法

Standard Type
GBT
ICS
31.080.99
CCS
L55
Status
即将实施
Issue Date
2026-02-27
Implementation
2026-09-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A