GB/T 47239.8-2026

Upcoming

Semiconductor devices—Flexible and stretchable semiconductor devices—Part 8: Test method for stretchability, flexibility and stability of flexible resistive memory

半导体器件 柔性可拉伸半导体器件 第8部分：柔性电阻存储器延展性、柔韧性和稳定性测试方法

Standard Type
GBT
ICS
31.080.99
CCS
L55
Status
即将实施
Issue Date
2026-02-27
Implementation
2026-09-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A