GB/T 47080-2026

Upcoming

Test method for dislocation density of diamond single crystal polished wafer

金刚石单晶抛光片位错密度的测试方法

Standard Type
GBT
ICS
77.040
CCS
H17
Status
即将实施
Issue Date
2026-01-28
Implementation
2026-08-01
Responsible Dept
国家标准委
Drafting Unit
N/A