GB/T 45770-2025

Active

Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

表面化学分析 原子力显微术 用于纳米结构测量的原子力显微镜探针柄轮廓原位表征程序

Standard Type
GBT
ICS
71.040.40
CCS
G 04
Status
现行
Issue Date
2025-06-30
Implementation
2026-01-01
Responsible Dept
中国科学院
Drafting Unit
N/A