GB/T 45723-2025

Active

Test method for printed board—Monitoring of single plated-through hole(PTH) resistance change during temperature cycling

印制电路板测试方法 温度循环状态下镀覆孔单孔电阻的变化

Standard Type
GBT
ICS
31.180
CCS
L30
Status
现行
Issue Date
2025-05-30
Implementation
2025-12-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A