GB/T 45722-2025

Active

Semiconductor devices—Constant current electromigration test

半导体器件 恒流电迁移试验

Standard Type
GBT
ICS
31.080.01
CCS
L40
Status
现行
Issue Date
2025-05-30
Implementation
2025-09-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A