GB/T 45720-2025

Active

Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for gate dielectric films

半导体器件 栅介质层的时间相关介电击穿（TDDB）试验

Standard Type
GBT
ICS
31.080.01
CCS
L55
Status
现行
Issue Date
2025-05-30
Implementation
2025-09-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A