GB/T 45459-2025

Active

Microbeam analysis—Focused ion beam—Preparation of TEM specimens

微束分析 聚焦离子束 透射电镜试样制备方法

Standard Type
GBT
ICS
71.040.40
CCS
G 04
Status
现行
Issue Date
2025-03-28
Implementation
2025-10-01
Responsible Dept
国家标准委
Drafting Unit
N/A