GB/T 44558-2024

Active

Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy

III族氮化物半导体材料中位错成像的测试 透射电子显微镜法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2024-09-29
Implementation
2025-04-01
Responsible Dept
国家标准委
Drafting Unit
N/A