Home / Standards / GB/T 43894.2-2026 GB/T 43894.2-2026 Upcoming Practice for determining semiconductor wafer near-edge geometry—Part 2: Roll-off amount(ROA) 半导体晶片近边缘几何形态评价 第2部分:边缘卷曲法(ROA) Standard Type GBT ICS 77.040 CCS H21 Status 即将实施 Issue Date 2026-01-28 Implementation 2026-08-01 Responsible Dept 国家标准委 Drafting Unit N/A