GB/T 43226-2023

Active

Time-domain test methods for space single event soft errors of semiconductor integrated circuit

宇航用半导体集成电路单粒子软错误时域测试方法

Standard Type
GBT
ICS
49.140
CCS
V25
Status
现行
Issue Date
2023-09-07
Implementation
2024-01-01
Responsible Dept
国家标准委
Drafting Unit
N/A