GB/T 43087-2023

Active

Microbeam analysis—Analytical electron microscopy—Method for the determination of interface position in the cross-sectional image of the layered materials

微束分析 分析电子显微术 层状材料截面像中界面位置的确定方法

Standard Type
GBT
ICS
71.040.50
CCS
N33
Status
现行
Issue Date
2023-09-07
Implementation
2024-04-01
Responsible Dept
国家标准委
Drafting Unit
N/A