GB/T 42975-2023

Active

Semiconductor integrated circuits—Test method of driver device

半导体集成电路 驱动器测试方法

Standard Type
GBT
ICS
31.200
CCS
L56
Status
现行
Issue Date
2023-09-07
Implementation
2024-01-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A