GB/T 42907-2023

Active

Test method for excess-charge-carrier recombination lifetime in silicon ingots, silicon bricks and silicon wafers—Noncontact eddy-current sensor

硅锭、硅块和硅片中非平衡载流子复合寿命的测试 非接触涡流感应法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2023-08-06
Implementation
2024-03-01
Responsible Dept
国家标准委
Drafting Unit
N/A