GB/T 42789-2023

Active

Test method for gloss of silicon wafer

硅片表面光泽度的测试方法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2023-08-06
Implementation
2024-03-01
Responsible Dept
国家标准委
Drafting Unit
N/A