GB/T 42676-2023

Active

Test method for crystalline quality of semiconductive single crystal—X-ray diffraction method

半导体单晶晶体质量的测试 X射线衍射法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2023-08-06
Implementation
2024-03-01
Responsible Dept
国家标准委
Drafting Unit
N/A