GB/T 41805-2022

Active

Methodology for the quantitative inspection of the defect on optics surface—Microscopic scattering dark-field imaging

光学元件表面疵病定量检测方法 显微散射暗场成像法

Standard Type
GBT
ICS
81.040.01
CCS
N05
Status
现行
Issue Date
2022-10-14
Implementation
2023-05-01
Responsible Dept
中国兵器工业集团公司
Drafting Unit
N/A