GB/T 41751-2022

Active

Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers

氮化镓单晶衬底片晶面曲率半径测试方法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2022-10-14
Implementation
2023-02-01
Responsible Dept
国家标准委
Drafting Unit
N/A