GB/T 36969-2018

Active

Nanotechnology—Method for the measurement of the nanofilm-thickness by atomic force microscopy

纳米技术 原子力显微术测定纳米薄膜厚度的方法

Standard Type
GBT
ICS
17.040.20
CCS
J04
Status
现行
Issue Date
2018-12-28
Implementation
2018-12-28
Responsible Dept
中国科学院
Drafting Unit
N/A