GB/T 35007-2018

Active

Semiconductor integrated circuits—Measuring method of low voltage differential signaling circuitry

半导体集成电路 低电压差分信号电路测试方法

Standard Type
GBT
ICS
31.200
CCS
L56
Status
现行
Issue Date
2018-03-15
Implementation
2018-08-01
Responsible Dept
工业和信息化部（电子）
Drafting Unit
N/A