GB/T 34174-2017

Active

Surface chemical analysis—Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation

表面化学分析 工作参考物质中离子注入产生的驻留面剂量定值的推荐程序

Standard Type
GBT
ICS
71.040.40
CCS
G04
Status
现行
Issue Date
2017-09-07
Implementation
2018-08-01
Responsible Dept
中国科学院
Drafting Unit
N/A