GB/T 33922-2017

Active

Wafer level test methods for MEMS piezoresistive pressure-sensitive die performances

MEMS压阻式压力敏感芯片性能的圆片级试验方法

Standard Type
GBT
ICS
31.200
CCS
L55
Status
现行
Issue Date
2017-07-12
Implementation
2018-02-01
Responsible Dept
国家标准委
Drafting Unit
N/A