Home / Standards / GB/T 33236-2016 GB/T 33236-2016 Active Polycrystalline silicon—Determination of trace elements—Glow discharge mass spectrometry method 多晶硅 痕量元素化学分析 辉光放电质谱法 Standard Type GBT ICS 71.040.40 CCS G04 Status 现行 Issue Date 2016-12-13 Implementation 2017-11-01 Responsible Dept 中国科学院 Drafting Unit N/A