GB/T 32651-2016

Active

Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry

采用高质量分辨率辉光放电质谱法测量太阳能级硅中痕量元素的测试方法

Standard Type
GBT
ICS
29.045
CCS
H82
Status
现行
Issue Date
2016-04-25
Implementation
2016-11-01
Responsible Dept
国家标准委
Drafting Unit
N/A