GB/T 32188-2015

Active

The method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate

氮化镓单晶衬底片x射线双晶摇摆曲线半高宽测试方法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2015-12-10
Implementation
2016-11-01
Responsible Dept
国家标准委
Drafting Unit
N/A