GB/T 30869-2014

Active

Test method for thickness and total thickness variation of silicon wafers for solar cell

太阳能电池用硅片厚度及总厚度变化测试方法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2014-07-24
Implementation
2015-02-01
Responsible Dept
国家标准委
Drafting Unit
N/A