GB/T 30860-2014

Active

Test methods for surface roughness and saw mark of silicon wafers for solar cells

太阳能电池用硅片表面粗糙度及切割线痕测试方法

Standard Type
GBT
ICS
77.040
CCS
H21
Status
现行
Issue Date
2014-07-24
Implementation
2015-04-01
Responsible Dept
国家标准委
Drafting Unit
N/A