Home / Standards / GB/T 26068-2010 GB/T 26068-2010 Abolished Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 硅片载流子复合寿命的无接触微波反射光电导衰减测试方法 Standard Type GBT ICS 29.045 CCS H80 Status 废止 Issue Date 2011-01-10 Implementation 2011-10-01 Responsible Dept 国家标准委 Drafting Unit 国家标准委