Home / Standards / GB/T 26068 GB/T 26068 Active Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method 硅片和硅锭载流子复合寿命的测试 非接触微波反射光电导衰减法 Standard Type GBT ICS 77.040 CCS H21 Status 现行 Issue Date 2018-12-28 Implementation 2019-11-01 Responsible Dept 国家标准委 Drafting Unit 国家标准委