Home / Standards / GB/T 26067-2010 GB/T 26067-2010 Active Standard test method for dimensions of notches on silicon wafers 硅片切口尺寸测试方法 Standard Type GBT ICS 29.045 CCS H80 Status 现行 Issue Date 2011-01-10 Implementation 2011-10-01 Responsible Dept 国家标准委 Drafting Unit 国家标准委