Home / Standards / GB/T 26065-2010 GB/T 26065-2010 Active Specification for polished test silicon wafers 硅单晶抛光试验片规范 Standard Type GBT ICS 29.045 CCS H80 Status 现行 Issue Date 2011-01-10 Implementation 2011-10-01 Responsible Dept 国家标准委 Drafting Unit 国家标准委