GB/T 24582-2009

Abolished

Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry

酸浸取 电感耦合等离子质谱仪测定多晶硅表面金属杂质

Standard Type
GBT
ICS
29.045
CCS
H80
Status
废止
Issue Date
2009-10-30
Implementation
2010-06-01
Responsible Dept
国家标准委
Drafting Unit
N/A