GB/T 24576-2009

Active

Test method for measuring the Al fraction in AlGaAs on GaAs substrates by high resolution X-ray diffraction

高分辩率X射线衍射测量GaAs衬底生长的AlGaAs中Al成分的试验方法

Standard Type
GBT
ICS
29.045
CCS
H80
Status
现行
Issue Date
2009-10-30
Implementation
2010-06-01
Responsible Dept
国家标准委
Drafting Unit
N/A